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[n]	J. T. Yoskowitz et al., “Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 2840-2842. doi:10.18429/JACoW-IPAC2021-WEPAB104
[n]	A. Chanc?® and J. Payet, “The Beta-beam Decay Ring Design”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper WEPCH008, pp. 1933-1935. 

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