[n] C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834.
[n] V. Petrillo et al., “Analysis of Radiative Effects in the Electron Emission from the Photocathode and in the Acceleration inside the RF Cavity of a Photoinjector using the 3D Numerical Code RETAR”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper WEPCH127, pp. 2221-2223.
Use Complete Form