Reference Search

Favourites

For Word

[n]	Y. Tokuda and A. Usami, “Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy”, in Proc. PAC'81, Washington D.C., USA, Mar. 1981, pp. 3564-3569. 

[n]	G. Bienvenu et al., “Power Coupler Development for SC Cavities”, in Proc. EPAC'96, Sitges, Spain, Jun. 1996, paper WEP008L, pp. 2088-2090. 

[n]	H. Harada, K. Yamamoto, and S. Kato, “Ionization Profile Monitor (IPM) of J-PARC 3-GeV RCS”, in Proc. IPAC'13, Shanghai, China, May 2013, paper MOPME021, pp. 515-517. 

For LaTeX

%\cite{Tokuda:PAC81} \bibitem{Tokuda:PAC81} Y. Tokuda and A. Usami, \textquotedblleft{Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy}\textquotedblright, in \emph{Proc. PAC’81}, Washington D.C., USA, Mar. 1981, pp. 3564--3569. %\cite{Bienvenu:EPAC96-WEP008L} \bibitem{Bienvenu:EPAC96-WEP008L} G. Bienvenu \emph{et al.}, \textquotedblleft{Power Coupler Development for SC Cavities}\textquotedblright, in \emph{Proc. EPAC’96}, Sitges, Spain, Jun. 1996, paper WEP008L, pp. 2088--2090. %\cite{Harada:IPAC13-MOPME021} \bibitem{Harada:IPAC13-MOPME021} H. Harada, K. Yamamoto, and S. Kato, \textquotedblleft{Ionization Profile Monitor (IPM) of J-PARC 3-GeV RCS}\textquotedblright, in \emph{Proc. IPAC’13}, Shanghai, China, May 2013, paper MOPME021, pp. 515--517.

For BibTeX

@inproceedings{tokuda:pac81, author = {Y. Tokuda and A. Usami}, title = {{Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy}}, booktitle = {Proc. PAC'81}, pages = {3564--3569}, paper = {}, venue = {Washington D.C., USA, Mar. 1981}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{bienvenu:epac96-wep008l, author = {G. Bienvenu and others}, title = {{Power Coupler Development for SC Cavities}}, booktitle = {Proc. EPAC'96}, pages = {2088--2090}, paper = {WEP008L}, venue = {Sitges, Spain}, series = {European Particle Accelerator Conference}, number = {5}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {9}, year = {1996}, language = {english} } @inproceedings{harada:ipac13-mopme021, author = {H. Harada and K. Yamamoto and S. Kato}, title = {{Ionization Profile Monitor (IPM) of J-PARC 3-GeV RCS}}, booktitle = {Proc. IPAC'13}, pages = {515--517}, paper = {MOPME021}, venue = {Shanghai, China, May 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2013/papers/MOPME021.pdf}, language = {english} }

References

• Y. Tokuda and A. Usami, “Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy”, in Proc. 9th Particle Accelerator Conf. (PAC'81), Washington D.C., USA, Mar. 1981, pp. 3564-3569.
• G. Bienvenu et al., “Power Coupler Development for SC Cavities”, in Proc. 5th European Particle Accelerator Conf. (EPAC'96), Sitges, Spain, Jun. 1996, paper WEP008L, pp. 2088-2090.
• H. Harada, K. Yamamoto, and S. Kato, “Ionization Profile Monitor (IPM) of J-PARC 3-GeV RCS”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper MOPME021, pp. 515-517.