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[n]	N. Krupka et al., “Particulate Sampling and Analysis During Refurbishment of Prototype European XFEL Cryomodule”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 701-704. doi:10.18429/JACoW-SRF2019-TUP099
[n]	R. Boni, A. Gallo, and F. Marcellini, “High Power Test of the Waveguide Loaded RF Cavity for the Frascati PHI-Factory Main Rings”, in Proc. EPAC'96, Sitges, Spain, Jun. 1996, paper WEP032L, pp. 1979-1981. 
[n]	Y. Liu, J. Tong, and Q. Yuan, “EMI measurement for SXFEL klystron-modulator  system”, presented at the IPAC'24, Nashville, TN, USA, May 2024, paper THPS34, unpublished. 

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