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[n]	I. Ben-Zvi, R. Malone, X. J. Wang, and V. Yakimenko, “High-Resolution Beam Profile Monitor R&D at BNL ATF”, in Proc. EPAC'00, Vienna, Austria, Jun. 2000, paper WEP1B17, pp. 1821-1823. 

[n]	M. Roehrs, A. Bolzmann, K. Honkavaara, M. Huening, and H. Schlarb, “Measurement of Slice-Emmittance using Transverse Deflecting Structure”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper THPP036, pp. XX-XX. 

For LaTeX

%\cite{Ben-Zvi:EPAC00-WEP1B17} \bibitem{Ben-Zvi:EPAC00-WEP1B17} I. Ben-Zvi, R. Malone, X. J. Wang, and V. Yakimenko, \textquotedblleft{High-Resolution Beam Profile Monitor R&D at BNL ATF}\textquotedblright, in \emph{Proc. EPAC’00}, Vienna, Austria, Jun. 2000, paper WEP1B17, pp. 1821--1823. %\cite{Roehrs:FEL05-THPP036} \bibitem{Roehrs:FEL05-THPP036} M. Roehrs, A. Bolzmann, K. Honkavaara, M. Huening, and H. Schlarb, \textquotedblleft{Measurement of Slice-Emmittance using Transverse Deflecting Structure}\textquotedblright, in \emph{Proc. FEL’05}, Palo Alto, CA, USA, Aug. 2005, paper THPP036, pp. XX--XX.

For BibTeX

@inproceedings{ben-zvi:epac00-wep1b17, author = {I. Ben-Zvi and R. Malone and X. J. Wang and V. Yakimenko}, title = {{High-Resolution Beam Profile Monitor R&D at BNL ATF}}, booktitle = {Proc. EPAC'00}, pages = {1821--1823}, paper = {WEP1B17}, venue = {Vienna, Austria}, series = {European Particle Accelerator Conference}, number = {7}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {8}, year = {2000}, url = {https://jacow.org/e00/papers/WEP1B17.pdf}, language = {english} } @inproceedings{roehrs:fel05-thpp036, author = {M. Roehrs and A. Bolzmann and K. Honkavaara and M. Huening and H. Schlarb}, title = {{Measurement of Slice-Emmittance using Transverse Deflecting Structure}}, booktitle = {Proc. FEL'05}, paper = {THPP036}, venue = {Palo Alto, CA, USA, Aug. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/f05/papers/THPP036.pdf}, language = {english} }

References

• I. Ben-Zvi, R. Malone, X. J. Wang, and V. Yakimenko, “High-Resolution Beam Profile Monitor R&D at BNL ATF”, in Proc. 7th European Particle Accelerator Conf. (EPAC'00), Vienna, Austria, Jun. 2000, paper WEP1B17, pp. 1821-1823.
• M. Roehrs, A. Bolzmann, K. Honkavaara, M. Huening, and H. Schlarb, “Measurement of Slice-Emmittance using Transverse Deflecting Structure”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP036, pp. XX-XX.