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[n]	A. D. Palczewski, G. Ciovati, R. L. Geng, and Y. M. Li, “Exploration of Material Removal Rate of SRF Elliptical Cavities as a Function of Media Type and Cavity Shape on Niobium and Copper Using Centrifugal Barrel Polishing (CBP)”, in Proc. SRF'13, Paris, France, Sep. 2013, paper TUP064, pp. 579-582. 

[n]	J. M. Nogiec, K. Trombly-Freytag, D. Walbridge, and E. Desavouret, “An XML Driven Framework for Test Control and Data Analysis”, in Proc. ICALEPCS'01, San Jose, CA, USA, Nov. 2001, paper THAP073, pp. XX-XX. 

[n]	N. Suradet, G. G. Hoyes, P. Klysubun, S. Krainara, P. Sudmuang, and S. Teawphet, “Improvement of the Siam Photon Source Beam Loss Monitor System”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 190-192. doi:10.18429/JACoW-IBIC2015-MOPB058

For LaTeX

%\cite{Palczewski:SRF13-TUP064} \bibitem{Palczewski:SRF13-TUP064} A. D. Palczewski, G. Ciovati, R. L. Geng, and Y. M. Li, \textquotedblleft{Exploration of Material Removal Rate of SRF Elliptical Cavities as a Function of Media Type and Cavity Shape on Niobium and Copper Using Centrifugal Barrel Polishing (CBP)}\textquotedblright, in \emph{Proc. SRF’13}, Paris, France, Sep. 2013, paper TUP064, pp. 579--582. %\cite{Nogiec:ICALEPCS01-THAP073} \bibitem{Nogiec:ICALEPCS01-THAP073} J. M. Nogiec, K. Trombly-Freytag, D. Walbridge, and E. Desavouret, \textquotedblleft{An XML Driven Framework for Test Control and Data Analysis}\textquotedblright, in \emph{Proc. ICALEPCS’01}, San Jose, CA, USA, Nov. 2001, paper THAP073, pp. XX--XX. %\cite{Suradet:IBIC15-MOPB058} \bibitem{Suradet:IBIC15-MOPB058} N. Suradet, G. G. Hoyes, P. Klysubun, S. Krainara, P. Sudmuang, and S. Teawphet, \textquotedblleft{Improvement of the Siam Photon Source Beam Loss Monitor System}\textquotedblright, in \emph{Proc. IBIC’15}, Melbourne, Australia, Sep. 2015, pp. 190--192. \doi{10.18429/JACoW-IBIC2015-MOPB058}

For BibTeX

@inproceedings{palczewski:srf13-tup064, author = {A. D. Palczewski and G. Ciovati and R. L. Geng and Y. M. Li}, title = {{Exploration of Material Removal Rate of SRF Elliptical Cavities as a Function of Media Type and Cavity Shape on Niobium and Copper Using Centrifugal Barrel Polishing (CBP)}}, booktitle = {Proc. SRF'13}, pages = {579--582}, paper = {TUP064}, venue = {Paris, France, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2013/papers/TUP064.pdf}, language = {english} } @inproceedings{nogiec:icalepcs01-thap073, author = {J. M. Nogiec and K. Trombly-Freytag and D. Walbridge and E. Desavouret}, title = {{An XML Driven Framework for Test Control and Data Analysis}}, booktitle = {Proc. ICALEPCS'01}, paper = {THAP073}, venue = {San Jose, CA, USA, Nov. 2001}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/ica01/papers/THAP073.pdf}, language = {english} } @inproceedings{suradet:ibic15-mopb058, author = {N. Suradet and G. G. Hoyes and P. Klysubun and S. Krainara and P. Sudmuang and S. Teawphet}, title = {{Improvement of the Siam Photon Source Beam Loss Monitor System}}, booktitle = {Proc. IBIC'15}, pages = {190--192}, paper = {MOPB058}, venue = {Melbourne, Australia, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2015-MOPB058}, url = {https://jacow.org/IBIC2015/papers/MOPB058.pdf}, language = {english} }

References

• A. D. Palczewski, G. Ciovati, R. L. Geng, and Y. M. Li, “Exploration of Material Removal Rate of SRF Elliptical Cavities as a Function of Media Type and Cavity Shape on Niobium and Copper Using Centrifugal Barrel Polishing (CBP)”, in Proc. 16th Int. Conf. RF Superconductivity (SRF'13), Paris, France, Sep. 2013, paper TUP064, pp. 579-582.
• J. M. Nogiec, K. Trombly-Freytag, D. Walbridge, and E. Desavouret, “An XML Driven Framework for Test Control and Data Analysis”, in Proc. 8th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'01), San Jose, CA, USA, Nov. 2001, paper THAP073, pp. XX-XX.
• N. Suradet, G. G. Hoyes, P. Klysubun, S. Krainara, P. Sudmuang, and S. Teawphet, “Improvement of the Siam Photon Source Beam Loss Monitor System”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 190-192.