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[n]	M. Yoon and S. Oh, “Design Study of a New Central Region of the Princeton University AVF Cyclotron for High-Quality N=2 Beams”, in Proc. EPAC'88, Rome, Italy, Jun. 1988, pp. 1442-1445. 

[n]	G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 445-447. doi:10.18429/JACoW-IBIC2018-WEPB09

For LaTeX

%\cite{Yoon:EPAC88} \bibitem{Yoon:EPAC88} M. Yoon and S. Oh, \textquotedblleft{Design Study of a New Central Region of the Princeton University AVF Cyclotron for High-Quality N=2 Beams}\textquotedblright, in \emph{Proc. EPAC’88}, Rome, Italy, Jun. 1988, pp. 1442--1445. %\cite{Kim:IBIC18-WEPB09} \bibitem{Kim:IBIC18-WEPB09} G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, \textquotedblleft{Wire Scanner Measurements at the PAL-XFEL}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 445--447. \doi{10.18429/JACoW-IBIC2018-WEPB09}

For BibTeX

@inproceedings{yoon:epac88, author = {M. Yoon and S. Oh}, title = {{Design Study of a New Central Region of the Princeton University AVF Cyclotron for High-Quality N=2 Beams}}, booktitle = {Proc. EPAC'88}, pages = {1442--1445}, paper = {}, venue = {Rome, Italy, Jun. 1988}, series = {European Particle Accelerator Conference}, number = {1}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{kim:ibic18-wepb09, author = {G. Kim and H.-S. Kang and C. Kim and B. G. Oh and D. C. Shin}, title = {{Wire Scanner Measurements at the PAL-XFEL}}, booktitle = {Proc. IBIC'18}, pages = {445--447}, paper = {WEPB09}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPB09}, url = {https://jacow.org/IBIC2018/papers/WEPB09.pdf}, language = {english} }

References

• M. Yoon and S. Oh, “Design Study of a New Central Region of the Princeton University AVF Cyclotron for High-Quality N=2 Beams”, in Proc. 1st European Particle Accelerator Conf. (EPAC'88), Rome, Italy, Jun. 1988, pp. 1442-1445.
• G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 445-447.