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[n]	R. Fleming, C. M. Estes, J. M. Fisher, and E. A. Stout, “NIF Device Health Monitoring”, in Proc. ICALEPCS'13, San Francisco, CA, USA, Oct. 2013, paper TUPPC129, pp. 887-889. 
[n]	R. Bourque and G. Laughon, “Thermal Analysis of a Refined APT Power Coupler and Thermal Shield and the Effect on the Cryoplant”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper MPPH131, pp. 1083-1085. 

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