JaCoW Logo

Reference Search

Favourites


For Word

[n]	H. Ito et al., “Lower Critical Field Measurement of NbN Multilayer Thin Film Superconductor at KEK”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 632-636. doi:10.18429/JACoW-SRF2019-TUP078
[n]	E. Lessner and J. W. Lewellen, “An Emittance Algorithm for a High-Intensity Low-Emittance Beam”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper RPAH002, pp. 2842-2844. 

For LaTeX

Use Complete Form

For BibTeX

References

Back to search