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[n]	X. Tao and G. C. Wang, “The Calculation of Leaked Electromagnetic Field in Gallery of Klystron of NSRL”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper RPAH313, pp. 3200-3202. 

[n]	P. Yuan et al., “Laser Evaporated Aluminium in ECR2 Ion Source”, in Proc. Cyclotrons'98, Caen, France, Jun. 1998, paper F-10, pp. 430-432. 

For LaTeX

%\cite{Tao:PAC01-RPAH313} \bibitem{Tao:PAC01-RPAH313} X. Tao and G. C. Wang, \textquotedblleft{The Calculation of Leaked Electromagnetic Field in Gallery of Klystron of NSRL}\textquotedblright, in \emph{Proc. PAC’01}, Chicago, IL, USA, Jun. 2001, paper RPAH313, pp. 3200--3202. %\cite{Yuan:Cyclotrons98-F-10} \bibitem{Yuan:Cyclotrons98-F-10} P. Yuan \emph{et al.}, \textquotedblleft{Laser Evaporated Aluminium in ECR2 Ion Source}\textquotedblright, in \emph{Proc. Cyclotrons’98}, Caen, France, Jun. 1998, paper F--10, pp. 430--432.

For BibTeX

@inproceedings{tao:pac01-rpah313, author = {X. Tao and G. C. Wang}, title = {{The Calculation of Leaked Electromagnetic Field in Gallery of Klystron of NSRL}}, booktitle = {Proc. PAC'01}, pages = {3200--3202}, paper = {RPAH313}, venue = {Chicago, IL, USA, Jun. 2001}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p01/papers/RPAH313.pdf}, language = {english} } @inproceedings{yuan:cyclotrons98-f-10, author = {P. Yuan and others}, title = {{Laser Evaporated Aluminium in ECR2 Ion Source}}, booktitle = {Proc. Cyclotrons'98}, pages = {430--432}, paper = {F-10}, venue = {Caen, France, Jun. 1998}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/c98/papers/F-10.pdf}, language = {english} }

References

• X. Tao and G. C. Wang, “The Calculation of Leaked Electromagnetic Field in Gallery of Klystron of NSRL”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper RPAH313, pp. 3200-3202.
• P. Yuan et al., “Laser Evaporated Aluminium in ECR2 Ion Source”, in Proc. 15th Int. Cyclotron Conf. and Their Applications (Cyclotrons'98), Caen, France, Jun. 1998, paper F-10, pp. 430-432.