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[n]	J. S. Chai et al., “Operation Experiences of MC50 Cyclotron, KIRAMS”, in Proc. APAC'04, Gyeongju, Korea, Mar. 2004, paper MOP10006, pp. XX-XX. 

[n]	R. Jones et al., “Real Time Display of the Vertical Beam Sizes in LEP Using the BEXE X-Ray Detector and Fast VME Based Computers”, in Proc. DIPAC'99, Chester, UK, May 1999, paper CT10, pp. XX-XX. 

[n]	N. Nakamura et al., “Electron-Beam Size Measurement with a Beam Profile Monitor Using Fresnel Zone Plates”, in Proc. PAC'03, Portland, OR, USA, May 2003, paper ROAB011, pp. 530-532. 

[n]	L. X. Hu, K. Z. Ding, Y. Song, and Y. C. Wu, “Calibration and Image Restoration for the Beam Profile Measurement System”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 276-280. doi:10.18429/JACoW-IBIC2020-THPP34

For LaTeX

%\cite{Chai:APAC04-MOP10006} \bibitem{Chai:APAC04-MOP10006} J. S. Chai \emph{et al.}, \textquotedblleft{Operation Experiences of MC50 Cyclotron, KIRAMS}\textquotedblright, in \emph{Proc. APAC’04}, Gyeongju, Korea, Mar. 2004, paper MOP10006, pp. XX--XX. %\cite{Jones:DIPAC99-CT10} \bibitem{Jones:DIPAC99-CT10} R. Jones \emph{et al.}, \textquotedblleft{Real Time Display of the Vertical Beam Sizes in LEP Using the BEXE X-Ray Detector and Fast VME Based Computers}\textquotedblright, in \emph{Proc. DIPAC’99}, Chester, UK, May 1999, paper CT10, pp. XX--XX. %\cite{Nakamura:PAC03-ROAB011} \bibitem{Nakamura:PAC03-ROAB011} N. Nakamura \emph{et al.}, \textquotedblleft{Electron-Beam Size Measurement with a Beam Profile Monitor Using Fresnel Zone Plates}\textquotedblright, in \emph{Proc. PAC’03}, Portland, OR, USA, May 2003, paper ROAB011, pp. 530--532. %\cite{LXHu:IBIC20-THPP34} \bibitem{LXHu:IBIC20-THPP34} L. X. Hu, K. Z. Ding, Y. Song, and Y. C. Wu, \textquotedblleft{Calibration and Image Restoration for the Beam Profile Measurement System}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 276--280. \doi{10.18429/JACoW-IBIC2020-THPP34}

For BibTeX

@inproceedings{chai:apac04-mop10006, author = {J. S. Chai and others}, title = {{Operation Experiences of MC50 Cyclotron, KIRAMS}}, booktitle = {Proc. APAC'04}, paper = {MOP10006}, venue = {Gyeongju, Korea, Mar. 2004}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/a04/papers/MOP10006.pdf}, language = {english} } @inproceedings{jones:dipac99-ct10, author = {R. Jones and others}, title = {{Real Time Display of the Vertical Beam Sizes in LEP Using the BEXE X-Ray Detector and Fast VME Based Computers}}, booktitle = {Proc. DIPAC'99}, paper = {CT10}, venue = {Chester, UK, May 1999}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/d99/papers/CT10.pdf}, language = {english} } @inproceedings{nakamura:pac03-roab011, author = {N. Nakamura and others}, title = {{Electron-Beam Size Measurement with a Beam Profile Monitor Using Fresnel Zone Plates}}, booktitle = {Proc. PAC'03}, pages = {530--532}, paper = {ROAB011}, venue = {Portland, OR, USA, May 2003}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p03/papers/ROAB011.pdf}, language = {english} } @inproceedings{lxhu:ibic20-thpp34, author = {L. X. Hu and K. Z. Ding and Y. Song and Y. C. Wu}, title = {{Calibration and Image Restoration for the Beam Profile Measurement System}}, booktitle = {Proc. IBIC'20}, pages = {276--280}, paper = {THPP34}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-THPP34}, url = {http://accelconf.web.cern.ch/ibic2020/papers/THPP34.pdf}, language = {english} }

References

• J. S. Chai et al., “Operation Experiences of MC50 Cyclotron, KIRAMS”, in Proc. 3rd Asian Particle Accelerator Conf. (APAC'04), Gyeongju, Korea, Mar. 2004, paper MOP10006, pp. XX-XX.
• R. Jones et al., “Real Time Display of the Vertical Beam Sizes in LEP Using the BEXE X-Ray Detector and Fast VME Based Computers”, in Proc. 4th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'99), Chester, UK, May 1999, paper CT10, pp. XX-XX.
• N. Nakamura et al., “Electron-Beam Size Measurement with a Beam Profile Monitor Using Fresnel Zone Plates”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper ROAB011, pp. 530-532.
• L. X. Hu, K. Z. Ding, Y. Song, and Y. C. Wu, “Calibration and Image Restoration for the Beam Profile Measurement System”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 276-280.