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[n]	K. Hayashi, M. Irikura, M. Y. Miyake, Y. Okubo, and H. Urakata, “Development of High-power Microwave Devices in Toshiba”, in Proc. APAC'07, Indore, India, Jan.-Feb. 2007, paper WEPMA139, pp. 511-513. 

[n]	H. Ikeda et al., “Vertical Beam Size Measurement by Streak Camera under Colliding and Single Beam Conditions in KEKB”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper RPAT052, pp. 3194-3196. 

For LaTeX

%\cite{Hayashi:APAC07-WEPMA139} \bibitem{Hayashi:APAC07-WEPMA139} K. Hayashi, M. Irikura, M. Y. Miyake, Y. Okubo, and H. Urakata, \textquotedblleft{Development of High-power Microwave Devices in Toshiba}\textquotedblright, in \emph{Proc. APAC’07}, Indore, India, Jan.-Feb. 2007, paper WEPMA139, pp. 511--513. %\cite{Ikeda:PAC05-RPAT052} \bibitem{Ikeda:PAC05-RPAT052} H. Ikeda \emph{et al.}, \textquotedblleft{Vertical Beam Size Measurement by Streak Camera under Colliding and Single Beam Conditions in KEKB}\textquotedblright, in \emph{Proc. PAC’05}, Knoxville, TN, USA, May 2005, paper RPAT052, pp. 3194--3196.

For BibTeX

@inproceedings{hayashi:apac07-wepma139, author = {K. Hayashi and M. Irikura and M. Y. Miyake and Y. Okubo and H. Urakata}, title = {{Development of High-power Microwave Devices in Toshiba}}, booktitle = {Proc. APAC'07}, pages = {511--513}, paper = {WEPMA139}, venue = {Indore, India, Jan.-Feb. 2007}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/a07/papers/WEPMA139.pdf}, language = {english} } @inproceedings{ikeda:pac05-rpat052, author = {H. Ikeda and others}, title = {{Vertical Beam Size Measurement by Streak Camera under Colliding and Single Beam Conditions in KEKB}}, booktitle = {Proc. PAC'05}, pages = {3194--3196}, paper = {RPAT052}, venue = {Knoxville, TN, USA, May 2005}, series = {Particle Accelerator Conference}, number = {21}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p05/papers/RPAT052.pdf}, language = {english} }

References

• K. Hayashi, M. Irikura, M. Y. Miyake, Y. Okubo, and H. Urakata, “Development of High-power Microwave Devices in Toshiba”, in Proc. 4th Asian Particle Accelerator Conf. (APAC'07), Indore, India, Jan.-Feb. 2007, paper WEPMA139, pp. 511-513.
• H. Ikeda et al., “Vertical Beam Size Measurement by Streak Camera under Colliding and Single Beam Conditions in KEKB”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper RPAT052, pp. 3194-3196.