Reference Search

Favourites

For Word

[n]	S. Yu, E. Henestroza, S. Eylon, and M. Vella, “Electron Beam 3.5MV, 2ka Injector Diode Diagnostics for the DARHT Facility”, in Proc. LINAC'00, Monterey, CA, USA, Aug. 2000, paper TUB06, pp. 443-445. 

[n]	C. M. Spencer and S. J. Rhee, “Cost Based Failure Modes and Effects Analysis (FMEA) for Systems of Accelerator Magnets”, in Proc. PAC'03, Portland, OR, USA, May 2003, paper WPAB062, pp. 2177-2179. 

For LaTeX

%\cite{SYu:LINAC00-TUB06} \bibitem{SYu:LINAC00-TUB06} S. Yu, E. Henestroza, S. Eylon, and M. Vella, \textquotedblleft{Electron Beam 3.5MV, 2ka Injector Diode Diagnostics for the DARHT Facility}\textquotedblright, in \emph{Proc. LINAC’00}, Monterey, CA, USA, Aug. 2000, paper TUB06, pp. 443--445. %\cite{Spencer:PAC03-WPAB062} \bibitem{Spencer:PAC03-WPAB062} C. M. Spencer and S. J. Rhee, \textquotedblleft{Cost Based Failure Modes and Effects Analysis (FMEA) for Systems of Accelerator Magnets}\textquotedblright, in \emph{Proc. PAC’03}, Portland, OR, USA, May 2003, paper WPAB062, pp. 2177--2179.

For BibTeX

@inproceedings{syu:linac00-tub06, author = {S. Yu and E. Henestroza and S. Eylon and M. Vella}, title = {{Electron Beam 3.5MV, 2ka Injector Diode Diagnostics for the DARHT Facility}}, booktitle = {Proc. LINAC'00}, pages = {443--445}, paper = {TUB06}, venue = {Monterey, CA, USA, Aug. 2000}, series = {Linear Accelerator Conference}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/l00/papers/TUB06.pdf}, language = {english} } @inproceedings{spencer:pac03-wpab062, author = {C. M. Spencer and S. J. Rhee}, title = {{Cost Based Failure Modes and Effects Analysis (FMEA) for Systems of Accelerator Magnets}}, booktitle = {Proc. PAC'03}, pages = {2177--2179}, paper = {WPAB062}, venue = {Portland, OR, USA, May 2003}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p03/papers/WPAB062.pdf}, language = {english} }

References

• S. Yu, E. Henestroza, S. Eylon, and M. Vella, “Electron Beam 3.5MV, 2ka Injector Diode Diagnostics for the DARHT Facility”, in Proc. 20th Linear Accelerator Conf. (LINAC'00), Monterey, CA, USA, Aug. 2000, paper TUB06, pp. 443-445.
• C. M. Spencer and S. J. Rhee, “Cost Based Failure Modes and Effects Analysis (FMEA) for Systems of Accelerator Magnets”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper WPAB062, pp. 2177-2179.