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[n]	A. T. Wu, H. Baumgart, and D. Gu, “TEM Study of Niobium Surfaces Treated by Different Polishing Techniques”, in Proc. SRF'09, Berlin, Germany, Sep. 2009, paper TUPPO041, pp. 300-304. 
[n]	R. Jiang, F. Z. Chen, Z. C. Chen, and Y. B. Leng, “Identification of Faulty Beam Position Monitor Based Clustering by Fast Search and Find of Density Peaks”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 114-117. doi:10.18429/JACoW-IBIC2018-MOPC02

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