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[n]	K. A. Drees et al., “RHIC Quench Protection Diode Radiation Damage”, in Proc. NAPAC'19, Lansing, MI, USA, Sep. 2019, pp. 831-833. doi:10.18429/JACoW-NAPAC2019-WEPLH11

[n]	B. P. M. Liggins, J. W. McKenzie, P. H. Williams, and J. K. Jones, “Jitter Tolerance for CLARA”, in Proc. IPAC'13, Shanghai, China, May 2013, paper TUPEA060, pp. 1271-1273. 

[n]	C. P. Chu, D. G. Maxwell, Y. Zhang, C. K. Allen, T. A. Pelaia II, and A. P. Shishlo, “Open XAL Control Room Experience”, in Proc. IPAC'15, Richmond, VA, USA, May 2015, pp. 1214-1216. doi:10.18429/JACoW-IPAC2015-MOPWI027

For LaTeX

%\cite{Drees:NAPAC19-WEPLH11} \bibitem{Drees:NAPAC19-WEPLH11} K. A. Drees \emph{et al.}, \textquotedblleft{RHIC Quench Protection Diode Radiation Damage}\textquotedblright, in \emph{Proc. NAPAC’19}, Lansing, MI, USA, Sep. 2019, pp. 831--833. \url{doi:10.18429/JACoW-NAPAC2019-WEPLH11} %\cite{Liggins:IPAC13-TUPEA060} \bibitem{Liggins:IPAC13-TUPEA060} B. P. M. Liggins, J. W. McKenzie, P. H. Williams, and J. K. Jones, \textquotedblleft{Jitter Tolerance for CLARA}\textquotedblright, in \emph{Proc. IPAC’13}, Shanghai, China, May 2013, paper TUPEA060, pp. 1271--1273. %\cite{Chu:IPAC15-MOPWI027} \bibitem{Chu:IPAC15-MOPWI027} C. P. Chu, D. G. Maxwell, Y. Zhang, C. K. Allen, T. A. Pelaia II, and A. P. Shishlo, \textquotedblleft{Open XAL Control Room Experience}\textquotedblright, in \emph{Proc. IPAC’15}, Richmond, VA, USA, May 2015, pp. 1214--1216. \url{doi:10.18429/JACoW-IPAC2015-MOPWI027}

For BibTeX

@inproceedings{drees:napac19-weplh11, author = {K. A. Drees and others}, title = {{RHIC Quench Protection Diode Radiation Damage}}, booktitle = {Proc. NAPAC'19}, pages = {831--833}, paper = {WEPLH11}, venue = {Lansing, MI, USA, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-NAPAC2019-WEPLH11}, url = {https://jacow.org/napac2019/papers/WEPLH11.pdf}, language = {english} } @inproceedings{liggins:ipac13-tupea060, author = {B. P. M. Liggins and J. W. McKenzie and P. H. Williams and J. K. Jones}, title = {{Jitter Tolerance for CLARA}}, booktitle = {Proc. IPAC'13}, pages = {1271--1273}, paper = {TUPEA060}, venue = {Shanghai, China, May 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2013/papers/TUPEA060.pdf}, language = {english} } @inproceedings{chu:ipac15-mopwi027, author = {C. P. Chu and D. G. Maxwell and Y. Zhang and C. K. Allen and T. A. Pelaia II and A. P. Shishlo}, title = {{Open XAL Control Room Experience}}, booktitle = {Proc. IPAC'15}, pages = {1214--1216}, paper = {MOPWI027}, venue = {Richmond, VA, USA, May 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2015-MOPWI027}, url = {https://jacow.org/IPAC2015/papers/MOPWI027.pdf}, language = {english} }

References

• K. A. Drees et al., “RHIC Quench Protection Diode Radiation Damage”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 831-833.
• B. P. M. Liggins, J. W. McKenzie, P. H. Williams, and J. K. Jones, “Jitter Tolerance for CLARA”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper TUPEA060, pp. 1271-1273.
• C. P. Chu, D. G. Maxwell, Y. Zhang, C. K. Allen, T. A. Pelaia II, and A. P. Shishlo, “Open XAL Control Room Experience”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 1214-1216.