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For Word

[n]	Y. Luo, F. C. Pilat, V. Ptitsyn, D. Trbojevic, and J. Wei, “Comparison of Off-Line IR Bump and Action-Angle Kick Minimization”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper MPPE030, pp. 2116-2118. 

[n]	W. Bruns, “Error Sensitivity Study for Side Coupled Muffin Tin Structures using a Finite Difference Program”, in Proc. PAC'95, Dallas, TX, USA, May 1995, paper RPA15, pp. 1085-1087. 

For LaTeX

%\cite{Luo:PAC05-MPPE030} \bibitem{Luo:PAC05-MPPE030} Y. Luo, F. C. Pilat, V. Ptitsyn, D. Trbojevic, and J. Wei, \textquotedblleft{Comparison of Off-Line IR Bump and Action-Angle Kick Minimization}\textquotedblright, in \emph{Proc. PAC’05}, Knoxville, TN, USA, May 2005, paper MPPE030, pp. 2116--2118. %\cite{Bruns:PAC95-RPA15} \bibitem{Bruns:PAC95-RPA15} W. Bruns, \textquotedblleft{Error Sensitivity Study for Side Coupled Muffin Tin Structures using a Finite Difference Program}\textquotedblright, in \emph{Proc. PAC’95}, Dallas, TX, USA, May 1995, paper RPA15, pp. 1085--1087.

For BibTeX

@inproceedings{luo:pac05-mppe030, author = {Y. Luo and F. C. Pilat and V. Ptitsyn and D. Trbojevic and J. Wei}, title = {{Comparison of Off-Line IR Bump and Action-Angle Kick Minimization}}, booktitle = {Proc. PAC'05}, pages = {2116--2118}, paper = {MPPE030}, venue = {Knoxville, TN, USA, May 2005}, series = {Particle Accelerator Conference}, number = {21}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p05/papers/MPPE030.pdf}, language = {english} } @inproceedings{bruns:pac95-rpa15, author = {W. Bruns}, title = {{Error Sensitivity Study for Side Coupled Muffin Tin Structures using a Finite Difference Program}}, booktitle = {Proc. PAC'95}, pages = {1085--1087}, paper = {RPA15}, venue = {Dallas, TX, USA, May 1995}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} }

References

• Y. Luo, F. C. Pilat, V. Ptitsyn, D. Trbojevic, and J. Wei, “Comparison of Off-Line IR Bump and Action-Angle Kick Minimization”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper MPPE030, pp. 2116-2118.
• W. Bruns, “Error Sensitivity Study for Side Coupled Muffin Tin Structures using a Finite Difference Program”, in Proc. 16th Particle Accelerator Conf. (PAC'95), Dallas, TX, USA, May 1995, paper RPA15, pp. 1085-1087.