[n] C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834.
[n] K. Rothemund and U. van Rienen, “Wake Field Calculation for the TTF-FEL Bunch Compressor Section”, in Proc. PAC'99, New York, NY, USA, Mar. 1999, paper THA82, pp. 2787-2789.
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