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[n]	N. Sitaraman et al., “Progress on Zirconium-Doped Niobium Surfaces”, in Proc. SRF'23, Grand Rapids, MI, USA, Jun. 2023, paper TUPTB004, pp. 398-400. 
[n]	W. C. Sellyey and J. D. Gilpatrick, “A Compact Residual Gas Ionization Profile Monitor (RGIPM) System”, in Proc. PAC'99, New York, NY, USA, Mar. 1999, paper WEA122, pp. 2152-2154. 

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