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[n]	A. Navitski, E. Elsen, V. Myronenko, J. Schaffran, O. Turkot, and Y. Tamashevich, “Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper MOPB072, pp. 281-285. 

[n]	C. E. Reece, J. K. Spradlin, O. Trofimova, and A-M. Valente-Feliciano, “Standardized Beamline Particulate Characterization Analysis: Initial Application to CEBAF and LCLS-II Cryomodule Components”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 647-650. doi:10.18429/JACoW-SRF2017-TUPB106

For LaTeX

%\cite{Navitski:SRF15-MOPB072} \bibitem{Navitski:SRF15-MOPB072} A. Navitski, E. Elsen, V. Myronenko, J. Schaffran, O. Turkot, and Y. Tamashevich, \textquotedblleft{Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities}\textquotedblright, in \emph{Proc. SRF’15}, Whistler, Canada, Sep. 2015, paper MOPB072, pp. 281--285. %\cite{Reece:SRF17-TUPB106} \bibitem{Reece:SRF17-TUPB106} C. E. Reece, J. K. Spradlin, O. Trofimova, and A-M. Valente-Feliciano, \textquotedblleft{Standardized Beamline Particulate Characterization Analysis: Initial Application to CEBAF and LCLS-II Cryomodule Components}\textquotedblright, in \emph{Proc. SRF’17}, Lanzhou, China, Jul. 2017, pp. 647--650. \doi{10.18429/JACoW-SRF2017-TUPB106}

For BibTeX

@inproceedings{navitski:srf15-mopb072, author = {A. Navitski and E. Elsen and V. Myronenko and J. Schaffran and O. Turkot and Y. Tamashevich}, title = {{Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities}}, booktitle = {Proc. SRF'15}, pages = {281--285}, paper = {MOPB072}, venue = {Whistler, Canada, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2015/papers/MOPB072.pdf}, language = {english} } @inproceedings{reece:srf17-tupb106, author = {C. E. Reece and J. K. Spradlin and O. Trofimova and A-M. Valente-Feliciano}, title = {{Standardized Beamline Particulate Characterization Analysis: Initial Application to CEBAF and LCLS-II Cryomodule Components}}, booktitle = {Proc. SRF'17}, pages = {647--650}, paper = {TUPB106}, venue = {Lanzhou, China, Jul. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-SRF2017-TUPB106}, url = {https://jacow.org/srf2017/papers/TUPB106.pdf}, language = {english} }

References

• A. Navitski, E. Elsen, V. Myronenko, J. Schaffran, O. Turkot, and Y. Tamashevich, “Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities”, in Proc. 17th Int. Conf. RF Superconductivity (SRF'15), Whistler, Canada, Sep. 2015, paper MOPB072, pp. 281-285.
• C. E. Reece, J. K. Spradlin, O. Trofimova, and A-M. Valente-Feliciano, “Standardized Beamline Particulate Characterization Analysis: Initial Application to CEBAF and LCLS-II Cryomodule Components”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 647-650.