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[n]	T. L. Houck, G. J. Caporaso, C. C. Shang, S. E. Sampayan, N. E. Molau, and M. L. Krogh, “Measured and Theoretical Characterization of the RF Properties of Stacked, High-Gradient Insulator Material”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 9P107, pp. 2627-2629. 

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