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[n]	D. H. Nordby, “Ion Source Work at ANL”, in Proc. LINAC'64, Madison, WI, USA, Jul. 1964, paper PART5-2, pp. 470-473. 
[n]	H. S. Sandberg et al., “Measuring the Beam Profile by Counting Ionization Electrons”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 257-260. doi:10.18429/JACoW-IBIC2019-TUBO04
[n]	H. G. Blosser, “Beam Quality Measurements and Focusing Grid Studies”, in Proc. Cyclotrons'59, Oak Ridge, TN, USA, Jul. 1959, paper CYC59D06, pp. 203-207. 
[n]	F. Eozenou, M. Bruchon, and J. Gantier, “Parameters Investigation for Niobium Electro-Polishing”, in Proc. SRF'07, Beijing, China, Oct. 2007, paper TUP71, pp. XX-XX. 

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