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[n]	A. P. Zhukov, S. Assadi, R. Dickson, V. Gaidash, and J. Pogge, “SNS BLM System Evolution: Detectors, Electronics, and Software”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper FR5REP038, pp. 4853-4855. 
[n]	S. U. De Silva, J. R. Delayen, H. Park, P. Berrutti, and N. A. Huque, “Room Temperature Measurements of Higher Order Modes for the SPS Prototype RF-Dipole Crabbing Cavity”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 3805-3807. doi:10.18429/JACoW-IPAC2018-THPAL067
[n]	P. Adams, N. A. Kling, C. Liu, and G. J. Marr, “Use of the Base-Band Tune Meter Kickers During the FY18 STAR Fixed Target Run at 3.85 GeV/u”, in Proc. NAPAC'19, Lansing, MI, USA, Sep. 2019, pp. 820-822. doi:10.18429/JACoW-NAPAC2019-WEPLH08
[n]	J. W. Hurd et al., “Commissioning Plans for SSC Linac”, in Proc. LINAC'92, Ottawa, Canada, Aug. 1992, paper TU4-53, pp. 462-464. 
[n]	J. Sekutowicz, D. Proch, and C. Tang, “Note on the SC Linear Collider TESLA Cavity Design”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 3P023, pp. 3081-3083. 
[n]	H. P. Chang, C. C. Kuo, M. H. Wang, and W. T. Weng, “Beam Lifetime Investigations at SRRC”, in Proc. EPAC'96, Sitges, Spain, Jun. 1996, paper WEP119G, pp. 697-699. 
[n]	T. V. Gorlov et al., “Laser Stripping of H⁻ Beam”, in Proc. HB'23, Geneva, Switzerland, Oct. 2023, pp. 141-146. doi:10.18429/JACoW-HB2023-TUC3I3
[n]	J. J. Bisognano, S. A. Heifets, and B. C. Yunn, “Loss Parameters for Very Short Bunches”, in Proc. EPAC'88, Rome, Italy, Jun. 1988, pp. 708-711. 
[n]	C.-S. Hwang et al., “Superconducting Insertion Devices for Synchrotron Hard X-ray at SRRC”, in Proc. EPAC'02, Paris, France, Jun. 2002, paper TUPLE037, pp. 2613-2615. 
[n]	F. C. Zhao et al., “Superconducting Elliptical Cavity (beta=0.45) and SRF Test Facility in IHEP”, in Proc. SRF'07, Beijing, China, Oct. 2007, paper TUP85, pp. XX-XX. 
[n]	M. Pekeler, K. Dunkel, M. Peiniger, C. Piel, H. Vogel, and P. vom Stein, “RF activities of ACCEL Instruments in Asia-Pacific”, in Proc. APAC'07, Indore, India, Jan.-Feb. 2007, paper THPMA104, pp. 791-793. 

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