[n] S. Leontein and E. Westlin, “Destructive Beam Profile Monitor Electronics using Gated Current Integrators”, in Proc. EPAC'98, Stockholm, Sweden, Jun. 1998, paper WEP10E, pp. 1550-1552.
[n] V. I. Pershin et al., “Metal-Vapor Vacuum-Arc Ion Source with An Additional Anode”, in Proc. LINAC'02, Gyeongju, Korea, Aug. 2002, paper TH434, pp. 677-679.
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