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[n]	T. C. Zhao et al., “The Beam Instruments for HIMM@IMP”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 33-35. doi:10.18429/JACoW-IBIC2018-MOPA04

[n]	J. Chen, Y. B. Leng, L. Y. Yu, and N. Zhang, “The Removal of Interference Noise of ICT using the PCA Method”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 22-25. doi:10.18429/JACoW-IBIC2018-MOOC03

For LaTeX

%\cite{Zhao:IBIC18-MOPA04} \bibitem{Zhao:IBIC18-MOPA04} T. C. Zhao \emph{et al.}, \textquotedblleft{The Beam Instruments for HIMM@IMP}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 33--35. \doi{10.18429/JACoW-IBIC2018-MOPA04} %\cite{Chen:IBIC18-MOOC03} \bibitem{Chen:IBIC18-MOOC03} J. Chen, Y. B. Leng, L. Y. Yu, and N. Zhang, \textquotedblleft{The Removal of Interference Noise of ICT using the PCA Method}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 22--25. \doi{10.18429/JACoW-IBIC2018-MOOC03}

For BibTeX

@inproceedings{zhao:ibic18-mopa04, author = {T. C. Zhao and others}, title = {{The Beam Instruments for HIMM@IMP}}, booktitle = {Proc. IBIC'18}, pages = {33--35}, paper = {MOPA04}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-MOPA04}, url = {https://jacow.org/IBIC2018/papers/MOPA04.pdf}, language = {english} } @inproceedings{chen:ibic18-mooc03, author = {J. Chen and Y. B. Leng and L. Y. Yu and N. Zhang}, title = {{The Removal of Interference Noise of ICT using the PCA Method}}, booktitle = {Proc. IBIC'18}, pages = {22--25}, paper = {MOOC03}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-MOOC03}, url = {https://jacow.org/IBIC2018/papers/MOOC03.pdf}, language = {english} }

References

• T. C. Zhao et al., “The Beam Instruments for HIMM@IMP”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 33-35.
• J. Chen, Y. B. Leng, L. Y. Yu, and N. Zhang, “The Removal of Interference Noise of ICT using the PCA Method”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 22-25.