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[n]	T. Ota et al., “Activities on Superconducting Cavities at Toshiba”, in Proc. SRF'97, Padova, Italy, Oct. 1997, paper SRF97A28, pp. 254-260. 

[n]	N. Vitoratou, P. Karataev, and G. Rehm, “Continuous Beam Energy Measurements at Diamond Light Source”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 107-110. doi:10.18429/JACoW-IBIC2018-MOPB16

For LaTeX

%\cite{Ota:SRF97-SRF97A28} \bibitem{Ota:SRF97-SRF97A28} T. Ota \emph{et al.}, \textquotedblleft{Activities on Superconducting Cavities at Toshiba}\textquotedblright, in \emph{Proc. SRF’97}, Padova, Italy, Oct. 1997, paper SRF97A28, pp. 254--260. %\cite{Vitoratou:IBIC18-MOPB16} \bibitem{Vitoratou:IBIC18-MOPB16} N. Vitoratou, P. Karataev, and G. Rehm, \textquotedblleft{Continuous Beam Energy Measurements at Diamond Light Source}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 107--110. \doi{10.18429/JACoW-IBIC2018-MOPB16}

For BibTeX

@inproceedings{ota:srf97-srf97a28, author = {T. Ota and others}, title = {{Activities on Superconducting Cavities at Toshiba}}, booktitle = {Proc. SRF'97}, pages = {254--260}, paper = {SRF97A28}, venue = {Padova, Italy, Oct. 1997}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF97/papers/SRF97A28.pdf}, language = {english} } @inproceedings{vitoratou:ibic18-mopb16, author = {N. Vitoratou and P. Karataev and G. Rehm}, title = {{Continuous Beam Energy Measurements at Diamond Light Source}}, booktitle = {Proc. IBIC'18}, pages = {107--110}, paper = {MOPB16}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-MOPB16}, url = {https://jacow.org/IBIC2018/papers/MOPB16.pdf}, language = {english} }

References

• T. Ota et al., “Activities on Superconducting Cavities at Toshiba”, in Proc. 8th Int. Conf. RF Superconductivity (SRF'97), Padova, Italy, Oct. 1997, paper SRF97A28, pp. 254-260.
• N. Vitoratou, P. Karataev, and G. Rehm, “Continuous Beam Energy Measurements at Diamond Light Source”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 107-110.