Reference Search

Favourites

For Word

[n]	Y. Bao, A. Caldwell, D. Greenwald, and G. X. Xia, “Frictional Cooling for a Slow Muon Source”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper WEPE047, pp. 3452-3454. 

[n]	G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 445-447. doi:10.18429/JACoW-IBIC2018-WEPB09

For LaTeX

%\cite{Bao:IPAC10-WEPE047} \bibitem{Bao:IPAC10-WEPE047} Y. Bao, A. Caldwell, D. Greenwald, and G. X. Xia, \textquotedblleft{Frictional Cooling for a Slow Muon Source}\textquotedblright, in \emph{Proc. IPAC’10}, Kyoto, Japan, May 2010, paper WEPE047, pp. 3452--3454. %\cite{Kim:IBIC18-WEPB09} \bibitem{Kim:IBIC18-WEPB09} G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, \textquotedblleft{Wire Scanner Measurements at the PAL-XFEL}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 445--447. \doi{10.18429/JACoW-IBIC2018-WEPB09}

For BibTeX

@inproceedings{bao:ipac10-wepe047, author = {Y. Bao and A. Caldwell and D. Greenwald and G. X. Xia}, title = {{Frictional Cooling for a Slow Muon Source}}, booktitle = {Proc. IPAC'10}, pages = {3452--3454}, paper = {WEPE047}, venue = {Kyoto, Japan, May 2010}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {http://accelconf.web.cern.ch/IPAC10/papers/WEPE047.pdf}, language = {english} } @inproceedings{kim:ibic18-wepb09, author = {G. Kim and H.-S. Kang and C. Kim and B. G. Oh and D. C. Shin}, title = {{Wire Scanner Measurements at the PAL-XFEL}}, booktitle = {Proc. IBIC'18}, pages = {445--447}, paper = {WEPB09}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPB09}, url = {https://jacow.org/IBIC2018/papers/WEPB09.pdf}, language = {english} }

References

• Y. Bao, A. Caldwell, D. Greenwald, and G. X. Xia, “Frictional Cooling for a Slow Muon Source”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper WEPE047, pp. 3452-3454.
• G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 445-447.