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For Word

[n]	G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 445-447. doi:10.18429/JACoW-IBIC2018-WEPB09

For LaTeX

%\cite{Kim:IBIC18-WEPB09} \bibitem{Kim:IBIC18-WEPB09} G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, \textquotedblleft{Wire Scanner Measurements at the PAL-XFEL}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 445--447. \url{doi:10.18429/JACoW-IBIC2018-WEPB09}

For BibTeX

@inproceedings{kim:ibic18-wepb09, author = {G. Kim and H.-S. Kang and C. Kim and B. G. Oh and D. C. Shin}, title = {{Wire Scanner Measurements at the PAL-XFEL}}, booktitle = {Proc. IBIC'18}, pages = {445--447}, paper = {WEPB09}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPB09}, url = {https://jacow.org/IBIC2018/papers/WEPB09.pdf}, language = {english} }

References

• G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 445-447.