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[n]	C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. Cyclotrons'19, Cape Town, South Africa, Sep. 2019, pp. 302-304. doi:10.18429/JACoW-CYCLOTRONS2019-THB04
[n]	Y. G. Wang et al., “Establishing a Laser Treatment to Suppress the Secondary Electron Emission”, in Proc. IPAC'19, Melbourne, Australia, May 2019, pp. 1303-1305. doi:10.18429/JACoW-IPAC2019-TUPMP029
[n]	G. Wang, Y. C. Jing, V. Litvinenko, and J. Ma, “Electron Beam Requirements for Coherent Electron Cooling FEL System”, in Proc. FEL'17, Santa Fe, NM, USA, Aug. 2017, pp. 323-325. doi:10.18429/JACoW-FEL2017-TUP039

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