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[n]	Y. Song, K. Fan, and C.-Y. Tsai, “Error Tolerance Characterization for the HUST MeV Ultrafast Electron Diffraction System”, in Proc. NAPAC'19, Lansing, MI, USA, Sep. 2019, pp. 166-169. doi:10.18429/JACoW-NAPAC2019-MOPLS08

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