[n] T. Zhang, S. M. Lund, T. Maruta, and C. Y. Wong, “High-Level Physics Application for the Emittance Measurement by Allison Scanner”, in Proc. NAPAC'19, Lansing, MI, USA, Sep. 2019, pp. 459-462. doi:10.18429/JACoW-NAPAC2019-TUPLS05
Use Complete Form