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[n]	J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, “Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 871-875. doi:10.18429/JACoW-SRF2019-THP017

[n]	J. Wlodek and K. J. Gofron, “ADUVC - an EPICS Areadetector Driver for USB Video Class Devices”, in Proc. ICALEPCS'19, New York, NY, USA, Oct. 2019, pp. 1499. doi:10.18429/JACoW-ICALEPCS2019-WEPHA174

For LaTeX

%\cite{Angle:SRF19-THP017} \bibitem{Angle:SRF19-THP017} J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, \textquotedblleft{Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS}\textquotedblright, in \emph{Proc. SRF’19}, Dresden, Germany, Jun.-Jul. 2019, pp. 871--875. \url{doi:10.18429/JACoW-SRF2019-THP017} %\cite{Wlodek:ICALEPCS19-WEPHA174} \bibitem{Wlodek:ICALEPCS19-WEPHA174} J. Wlodek and K. J. Gofron, \textquotedblleft{ADUVC - an EPICS Areadetector Driver for USB Video Class Devices}\textquotedblright, in \emph{Proc. ICALEPCS’19}, New York, NY, USA, Oct. 2019, pp. 1499. \url{doi:10.18429/JACoW-ICALEPCS2019-WEPHA174}

For BibTeX

@inproceedings{angle:srf19-thp017, author = {J. W. Angle and G. V. Eremeev and M. J. Kelley and U. Pudasaini and C. E. Reece and J. Tuggle}, title = {{Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS}}, booktitle = {Proc. SRF'19}, pages = {871--875}, paper = {THP017}, venue = {Dresden, Germany, Jun.-Jul. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-SRF2019-THP017}, url = {https://jacow.org/srf2019/papers/THP017.pdf}, language = {english} } @inproceedings{wlodek:icalepcs19-wepha174, author = {J. Wlodek and K. J. Gofron}, title = {{ADUVC - an EPICS Areadetector Driver for USB Video Class Devices}}, booktitle = {Proc. ICALEPCS'19}, pages = {1499}, paper = {WEPHA174}, venue = {New York, NY, USA}, series = {International Conference on Accelerator and Large Experimental Physics Control Systems}, number = {17}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2020}, issn = {2226-0358}, isbn = {978-3-95-450209-7}, doi = {10.18429/JACoW-ICALEPCS2019-WEPHA174}, url = {https://jacow.org/icalepcs2019/papers/WEPHA174.pdf}, language = {english} }

References

• J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, “Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 871-875.
• J. Wlodek and K. J. Gofron, “ADUVC - an EPICS Areadetector Driver for USB Video Class Devices”, in Proc. 17th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'19), New York, NY, USA, Oct. 2019, pp. 1499.