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[n]	H. Aoyagi, Y. Furukawa, and S. Takahashi, “Inclined X-ray Beam Position Monitors to Reduce Influence of Filling Pattern for the SPring-8 Photon Beamlines”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 37-40. doi:10.18429/JACoW-IBIC2020-TUPP06

For LaTeX

%\cite{Aoyagi:IBIC20-TUPP06} \bibitem{Aoyagi:IBIC20-TUPP06} H. Aoyagi, Y. Furukawa, and S. Takahashi, \textquotedblleft{Inclined X-ray Beam Position Monitors to Reduce Influence of Filling Pattern for the SPring-8 Photon Beamlines}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 37--40. \url{doi:10.18429/JACoW-IBIC2020-TUPP06}

For BibTeX

@inproceedings{aoyagi:ibic20-tupp06, author = {H. Aoyagi and Y. Furukawa and S. Takahashi}, title = {{Inclined X-ray Beam Position Monitors to Reduce Influence of Filling Pattern for the SPring-8 Photon Beamlines}}, booktitle = {Proc. IBIC'20}, pages = {37--40}, paper = {TUPP06}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-TUPP06}, url = {http://accelconf.web.cern.ch/ibic2020/papers/TUPP06.pdf}, language = {english} }

References

• H. Aoyagi, Y. Furukawa, and S. Takahashi, “Inclined X-ray Beam Position Monitors to Reduce Influence of Filling Pattern for the SPring-8 Photon Beamlines”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 37-40.