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[n]	Y. Zou, J. F. Chen, and J. Y. Tang, “Studies on Short-Bunch Extraction at CSNS RCS”, in Proc. NAPAC'13, Pasadena, CA, USA, Sep.-Oct. 2013, paper MOPMA03, pp. 297-299. 

[n]	V. Kumar and K.-J. Kim, “Numerical Simulation Studies of Smith-Purcell Free-Electron Lasers”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper TUPP026, pp. XX-XX. 

[n]	H. J. Choi et al., “PAL-XFEL's Turbo-ICT for Beam Charge Monitoring”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 118-120. doi:10.18429/JACoW-IBIC2015-MOPB036

[n]	H. Maesaka et al., “Design of the Beam Diagnostic System for the New 3 GeV Light Source in Japan”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 174-178. doi:10.18429/JACoW-IBIC2020-WEPP31

For LaTeX

%\cite{Zou:NAPAC13-MOPMA03} \bibitem{Zou:NAPAC13-MOPMA03} Y. Zou, J. F. Chen, and J. Y. Tang, \textquotedblleft{Studies on Short-Bunch Extraction at CSNS RCS}\textquotedblright, in \emph{Proc. NAPAC’13}, Pasadena, CA, USA, Sep.-Oct. 2013, paper MOPMA03, pp. 297--299. %\cite{Kumar:FEL05-TUPP026} \bibitem{Kumar:FEL05-TUPP026} V. Kumar and K.-J. Kim, \textquotedblleft{Numerical Simulation Studies of Smith-Purcell Free-Electron Lasers}\textquotedblright, in \emph{Proc. FEL’05}, Palo Alto, CA, USA, Aug. 2005, paper TUPP026, pp. XX--XX. %\cite{Choi:IBIC15-MOPB036} \bibitem{Choi:IBIC15-MOPB036} H. J. Choi \emph{et al.}, \textquotedblleft{PAL-XFEL's Turbo-ICT for Beam Charge Monitoring}\textquotedblright, in \emph{Proc. IBIC’15}, Melbourne, Australia, Sep. 2015, pp. 118--120. \url{doi:10.18429/JACoW-IBIC2015-MOPB036} %\cite{Maesaka:IBIC20-WEPP31} \bibitem{Maesaka:IBIC20-WEPP31} H. Maesaka \emph{et al.}, \textquotedblleft{Design of the Beam Diagnostic System for the New 3 GeV Light Source in Japan}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 174--178. \url{doi:10.18429/JACoW-IBIC2020-WEPP31}

For BibTeX

@inproceedings{zou:napac13-mopma03, author = {Y. Zou and J. F. Chen and J. Y. Tang}, title = {{Studies on Short-Bunch Extraction at CSNS RCS}}, booktitle = {Proc. NAPAC'13}, pages = {297--299}, paper = {MOPMA03}, venue = {Pasadena, CA, USA, Sep.-Oct. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/PAC2013/papers/MOPMA03.pdf}, language = {english} } @inproceedings{kumar:fel05-tupp026, author = {V. Kumar and K.-J. Kim}, title = {{Numerical Simulation Studies of Smith-Purcell Free-Electron Lasers}}, booktitle = {Proc. FEL'05}, paper = {TUPP026}, venue = {Palo Alto, CA, USA, Aug. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/f05/papers/TUPP026.pdf}, language = {english} } @inproceedings{choi:ibic15-mopb036, author = {H. J. Choi and others}, title = {{PAL-XFEL's Turbo-ICT for Beam Charge Monitoring}}, booktitle = {Proc. IBIC'15}, pages = {118--120}, paper = {MOPB036}, venue = {Melbourne, Australia, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2015-MOPB036}, url = {https://jacow.org/IBIC2015/papers/MOPB036.pdf}, language = {english} } @inproceedings{maesaka:ibic20-wepp31, author = {H. Maesaka and others}, title = {{Design of the Beam Diagnostic System for the New 3 GeV Light Source in Japan}}, booktitle = {Proc. IBIC'20}, pages = {174--178}, paper = {WEPP31}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-WEPP31}, url = {http://accelconf.web.cern.ch/ibic2020/papers/WEPP31.pdf}, language = {english} }

References

• Y. Zou, J. F. Chen, and J. Y. Tang, “Studies on Short-Bunch Extraction at CSNS RCS”, in Proc. North American Particle Accelerator Conf. (NAPAC'13), Pasadena, CA, USA, Sep.-Oct. 2013, paper MOPMA03, pp. 297-299.
• V. Kumar and K.-J. Kim, “Numerical Simulation Studies of Smith-Purcell Free-Electron Lasers”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper TUPP026, pp. XX-XX.
• H. J. Choi et al., “PAL-XFEL's Turbo-ICT for Beam Charge Monitoring”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 118-120.
• H. Maesaka et al., “Design of the Beam Diagnostic System for the New 3 GeV Light Source in Japan”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 174-178.