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[n]	D. C. Hagerman, “High Duty Factor RF Sources at 800 MHz”, in Proc. PAC'67, Washington D.C., USA, Mar. 1967, pp. 197-205. 

[n]	X. Y. Xu and Y. B. Leng, “Beam Coupling Impedance Analyze Using Bunch-by-Bunch Measurement”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 202-205. doi:10.18429/JACoW-IBIC2020-THAO04

For LaTeX

%\cite{Hagerman:PAC67} \bibitem{Hagerman:PAC67} D. C. Hagerman, \textquotedblleft{High Duty Factor RF Sources at 800 MHz}\textquotedblright, in \emph{Proc. PAC’67}, Washington D.C., USA, Mar. 1967, pp. 197--205. %\cite{XYXu:IBIC20-THAO04} \bibitem{XYXu:IBIC20-THAO04} X. Y. Xu and Y. B. Leng, \textquotedblleft{Beam Coupling Impedance Analyze Using Bunch-by-Bunch Measurement}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 202--205. \url{doi:10.18429/JACoW-IBIC2020-THAO04}

For BibTeX

@inproceedings{hagerman:pac67, author = {D. C. Hagerman}, title = {{High Duty Factor RF Sources at 800 MHz}}, booktitle = {Proc. PAC'67}, pages = {197--205}, paper = {}, venue = {Washington D.C., USA}, series = {Particle Accelerator Conference}, number = {2}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {6}, year = {1967}, language = {english} } @inproceedings{xyxu:ibic20-thao04, author = {X. Y. Xu and Y. B. Leng}, title = {{Beam Coupling Impedance Analyze Using Bunch-by-Bunch Measurement}}, booktitle = {Proc. IBIC'20}, pages = {202--205}, paper = {THAO04}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-THAO04}, url = {http://accelconf.web.cern.ch/ibic2020/papers/THAO04.pdf}, language = {english} }

References

• D. C. Hagerman, “High Duty Factor RF Sources at 800 MHz”, in Proc. 2nd Particle Accelerator Conf. (PAC'67), Washington D.C., USA, Mar. 1967, pp. 197-205.
• X. Y. Xu and Y. B. Leng, “Beam Coupling Impedance Analyze Using Bunch-by-Bunch Measurement”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 202-205.