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[n] K. R. Kim et al., “Proton Beam Energy Measurement Using Semiconductor Detectors at the 45MeV Test Beam Line of PEFP”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper FRPMN055, pp. 4126-4128.
[n] H.-J. Kwon et al., “Beam Tests of the PEFP 20 MeV Accelerator”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper THPP028, pp. 3434-3436.
[n] A. S. Romanenko, D. Bafia, A. Grassellino, M. Martinello, and Y. Trenikhina, “First Direct Imaging and Profiling TOF-SIMS Studies on Cutouts from Cavities Prepared by State-of-the-Art Treatments”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 866-870. doi:10.18429/JACoW-SRF2019-THP014
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References
- K. R. Kim et al., “Proton Beam Energy Measurement Using Semiconductor Detectors at the 45MeV Test Beam Line of PEFP”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper FRPMN055, pp. 4126-4128.
- H.-J. Kwon et al., “Beam Tests of the PEFP 20 MeV Accelerator”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper THPP028, pp. 3434-3436.
- A. S. Romanenko, D. Bafia, A. Grassellino, M. Martinello, and Y. Trenikhina, “First Direct Imaging and Profiling TOF-SIMS Studies on Cutouts from Cavities Prepared by State-of-the-Art Treatments”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 866-870.
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