Reference Search

Favourites

For Word

[n]	H.-W. Glock, J. Knobloch, A. Neumann, and A. Velez, “Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 725. doi:10.18429/JACoW-SRF2021-THOTEV07

[n]	I. H. Senevirathne, G. Ciovati, and J. R. Delayen, “Measurement of the Magnetic Field Penetration into Superconducting Thin Films”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 978-982. doi:10.18429/JACoW-SRF2019-THP050

For LaTeX

%\cite{H.-W:SRF21-THOTEV07} \bibitem{H.-W:SRF21-THOTEV07} H.-W. Glock, J. Knobloch, A. Neumann, and A. Velez, \textquotedblleft{Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 725. \doi{10.18429/JACoW-SRF2021-THOTEV07} %\cite{Senevirathne:SRF19-THP050} \bibitem{Senevirathne:SRF19-THP050} I. H. Senevirathne, G. Ciovati, and J. R. Delayen, \textquotedblleft{Measurement of the Magnetic Field Penetration into Superconducting Thin Films}\textquotedblright, in \emph{Proc. SRF’19}, Dresden, Germany, Jun.-Jul. 2019, pp. 978--982. \doi{10.18429/JACoW-SRF2019-THP050}

For BibTeX

@inproceedings{h.-w:srf21-thotev07, author = {H.-W. Glock and J. Knobloch and A. Neumann and A. Velez}, title = {{Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities}}, booktitle = {Proc. SRF'21}, pages = {725}, paper = {THOTEV07}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-THOTEV07}, url = {https://jacow.org/srf2021/papers/THOTEV07.pdf}, language = {english} } @inproceedings{senevirathne:srf19-thp050, author = {I. H. Senevirathne and G. Ciovati and J. R. Delayen}, title = {{Measurement of the Magnetic Field Penetration into Superconducting Thin Films}}, booktitle = {Proc. SRF'19}, pages = {978--982}, paper = {THP050}, venue = {Dresden, Germany, Jun.-Jul. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-SRF2019-THP050}, url = {https://jacow.org/srf2019/papers/THP050.pdf}, language = {english} }

References

• H.-W. Glock, J. Knobloch, A. Neumann, and A. Velez, “Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 725.
• I. H. Senevirathne, G. Ciovati, and J. R. Delayen, “Measurement of the Magnetic Field Penetration into Superconducting Thin Films”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 978-982.