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[n]	H. J. Choi, J. H. Han, H.-S. Kang, S. H. Kim, H.-G. Lee, and S. B. Lee, “HLS System to Measure the Location Changes in Real Time of PAL-XFEL Devices”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 2345-2348. doi:10.18429/JACoW-IPAC2018-WEPAL070

[n]	C. M. Caselle et al., “A Picosecond Sampling Electronic ``KAPTURE'' for Terahertz Synchrotron Radiation”, in Proc. IBIC'14, Monterey, CA, USA, Sep. 2014, paper MOCZB1, pp. 24-28. 

For LaTeX

%\cite{Choi:IPAC18-WEPAL070} \bibitem{Choi:IPAC18-WEPAL070} H. J. Choi, J. H. Han, H.-S. Kang, S. H. Kim, H.-G. Lee, and S. B. Lee, \textquotedblleft{HLS System to Measure the Location Changes in Real Time of PAL-XFEL Devices}\textquotedblright, in \emph{Proc. IPAC’18}, Vancouver, Canada, Apr.-May 2018, pp. 2345--2348. \doi{10.18429/JACoW-IPAC2018-WEPAL070} %\cite{Caselle:IBIC14-MOCZB1} \bibitem{Caselle:IBIC14-MOCZB1} C. M. Caselle \emph{et al.}, \textquotedblleft{A Picosecond Sampling Electronic ``KAPTURE'' for Terahertz Synchrotron Radiation}\textquotedblright, in \emph{Proc. IBIC’14}, Monterey, CA, USA, Sep. 2014, paper MOCZB1, pp. 24--28.

For BibTeX

@inproceedings{choi:ipac18-wepal070, author = {H. J. Choi and J. H. Han and H.-S. Kang and S. H. Kim and H.-G. Lee and S. B. Lee}, title = {{HLS System to Measure the Location Changes in Real Time of PAL-XFEL Devices}}, booktitle = {Proc. IPAC'18}, pages = {2345--2348}, paper = {WEPAL070}, venue = {Vancouver, Canada, Apr.-May 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2018-WEPAL070}, url = {http://accelconf.web.cern.ch/ipac2018/papers/WEPAL070.pdf}, language = {english} } @inproceedings{caselle:ibic14-moczb1, author = {C. M. Caselle and others}, title = {{A Picosecond Sampling Electronic ``KAPTURE'' for Terahertz Synchrotron Radiation}}, booktitle = {Proc. IBIC'14}, pages = {24--28}, paper = {MOCZB1}, venue = {Monterey, CA, USA, Sep. 2014}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2014/papers/MOCZB1.pdf}, language = {english} }

References

• H. J. Choi, J. H. Han, H.-S. Kang, S. H. Kim, H.-G. Lee, and S. B. Lee, “HLS System to Measure the Location Changes in Real Time of PAL-XFEL Devices”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2345-2348.
• C. M. Caselle et al., “A Picosecond Sampling Electronic ``KAPTURE'' for Terahertz Synchrotron Radiation”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOCZB1, pp. 24-28.