[n] L. Parsons Fran?ºa et al., “Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 476-480. doi:10.18429/JACoW-IBIC2022-WEP32
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Paper Title: Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines
Conference: 11th Int. Beam Instrumentation Conference (IBIC'22)
Paper ID: WEP32
Location in proceedings: 476-480
Original Author String: L. Parsons Fran?ºa,M. Duraffourg,E. Kukstas,F. Roncarolo,F. M. Velotti,C. P. Welsch,H. D. Zhang