[n] J. M. Schippers and H. H. Kiewiet, “A Beam Profile Monitor Using the Ionization of Residual Gas”, in Proc. 13th Int. Cyclotron Conf. and Their Applications (Cyclotrons'92), Vancouver, Canada, Jul. 1992, paper IXD-03, pp. 477-478.
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Paper Title: A Beam Profile Monitor Using the Ionization of Residual Gas
Paper URL: https://jacow.org/c92/papers/IXD-03.pdf
Conference: 13th Int. Cyclotron Conf. and Their Applications (Cyclotrons'92)
Paper ID: IXD-03
Location in proceedings: 477-478
Original Author String: J.M. Schippers, H.H. Kiewiet, Kernfysisch Versneller Instituut, Groningen, The Netherlands