[n] N. Baboi, B. Lorbeer, P. Zhang, N. Eddy, B. J. Fellenz, and M. Wendt, “HOM Choice Study with Test Electronics for use as Beam Position Diagnostics in 3.9 GHz Accelerating Cavities in FLASH”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper TUPA16, pp. 364-368.
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Paper Title: HOM Choice Study with Test Electronics for use as Beam Position Diagnostics in 3.9 GHz Accelerating Cavities in FLASH
Paper URL: https://jacow.org//IBIC2012/papers/TUPA16.pdf
Conference: 1st Int. Beam Instrumentation Conf. (IBIC'12)
Paper ID: TUPA16
Location in proceedings: 364-368
Original Author String: N. Baboi, B. Lorbeer, P. Zhang [DESY, Hamburg, Germany] N. Eddy, B.J. Fellenz, M. Wendt [Fermilab, Batavia, USA]