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Author: N. Baboi


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Reference
A. Ignatenko et al., “Beam Halo Monitor for FLASH and the European XFEL”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper MOPPR018, pp. 816-818.
P. Zhang, R. M. Jones, I. R. R. Shinton, N. Baboi, T. Flisgen, and U. van Rienen, “Status of Higher Order Mode Beam Position Monitors in 3.9 GHz Superconducting Accelerating Cavities at FLASH”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper MOPWA055, pp. 798-800.
F. Schmidt-Foehre, N. Baboi, G. Kuehn, B. Lorbeer, D. Noelle, and K. Wittenburg, “First Tests with the Self-triggered Mode of the New MicroTCA-based Low-charge Electronics for Button and Stripline BPMs at FLASH”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 3509-3511.
A. Kuramoto, N. Baboi, and H. Hayano, “Simulations and Measurements of Beam Pipe Modes excited in 9-cell Superconducting Cavities”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 2540-2542.
L. Shi, R. M. Jones, N. Baboi, and N. Y. Joshi, “Measurement of Beam Phase at FLASH using HOMs in Accelerating Cavities”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 686-688.
N. Y. Joshi, R. M. Jones, N. Baboi, and L. Shi, “Simulation of Electromagnetic Scattering Through the E-XFEL Third Harmonic Cavity Module”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 3001-3004.
S. Jablonski, N. Baboi, U. Mavric, and H. Schlarb, “RF Electronics for the Measurement of Beam Induced Higher Order Modes (HOM) Implemented in the MicroTCA.4 Form Factor”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 1916-1918.
B. Lorbeer, N. Baboi, H. T. Duhme, and Re. Neumann, “High Resolution and Low Charge Button and Strip-Line Beam Position Monitor Electronics Upgrade at Flash”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 1923-1926.
C. S. Simon et al., “New Electronics Design for the European XFEL Re-entrant Cavity Monitor”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA15, pp. 83-86.
N. Baboi, B. Lorbeer, P. Zhang, N. Eddy, B. J. Fellenz, and M. Wendt, “HOM Choice Study with Test Electronics for use as Beam Position Diagnostics in 3.9 GHz Accelerating Cavities in FLASH”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA16, pp. 364-368.


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