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[n]	N. Baboi, T. Hellert, L. Shi, T. Wamsat, R. M. Jones, and N. Y. Joshi, “HOM Characterization for Beam Diagnostics at the European XFEL Injector”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 616-619. doi:10.18429/JACoW-IBIC2016-WEPG03

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Paper Title: HOM Characterization for Beam Diagnostics at the European XFEL Injector
Paper URL: https://jacow.org/ibic2016/papers/WEPG03.pdf
Conference: 5th Int. Beam Instrumentation Conf. (IBIC'16)
Paper ID: WEPG03
Location in proceedings: 616-619
Original Author String: N. Baboi, T. Hellert, L. Shi, T. Wamsat [DESY, Hamburg, Germany] R.M. Jones, N.Y. Joshi, L. Shi [UMAN, Manchester, United Kingdom] N.Y. Joshi [University of Manchester, Manchester, United Kingdom]

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