[n] J. Wilgen and B. Beutner, “Fast Image Analysis for Beam Profile Measurement at the European XFEL”, in Proc. ICALEPCS'17, Barcelona, Spain, Oct. 2017, pp. 1416-1419. doi:10.18429/JACoW-ICALEPCS2017-THPHA031
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Paper Title: Fast Image Analysis for Beam Profile Measurement at the European XFEL
Paper URL: https://jacow.org/icalepcs2017/papers/THPHA031.pdf
Conference: 16th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'17)
Paper ID: THPHA031
Location in proceedings: 1416-1419
Original Author String: J. Wilgen, B. Beutner [DESY, Hamburg, Germany]