[n] F. Becker, C. A. Andre, P. Forck, and D. Hoffmann, “Beam Induced Fluorescence (BIF) Monitor for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams”, in Proc. DIPAC'07, Venice, Italy, May 2007, paper MOO3A02, pp. 33-35.
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Paper Title: Beam Induced Fluorescence (BIF) Monitor for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams
Paper URL: https://jacow.org/d07/papers/MOO3A02.pdf
Conference: 8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'07)
Paper ID: MOO3A02
Location in proceedings: 33-35
Original Author String: F. Becker, C. A. Andre, P. Forck, GSI, Darmstadt; D. Hoffmann, TU Darmstadt, Darmstadt