[n] S. Kato, H. Hayano, T. Kubo, T. Noguchi, T. Saeki, and M. Sawabe, “Study on Niobium Scratch and Tantalum or Carbonaceous Contamination at Niobium Surface with Field Emission Scanner”, in Proc. SRF'13, Paris, France, Sep. 2013, paper TUP108, pp. 731-735.
Use Complete Form
Paper Title: Study on Niobium Scratch and Tantalum or Carbonaceous Contamination at Niobium Surface with Field Emission Scanner
Paper URL: https://jacow.org/SRF2013/papers/TUP108.pdf
Conference: 16th Int. Conf. RF Superconductivity (SRF'13)
Paper ID: TUP108
Location in proceedings: 731-735
Original Author String: S. Kato, H. Hayano, T. Kubo, T. Noguchi, T. Saeki, M. Sawabe [KEK, Ibaraki, Japan]