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[n]	C. Y. Wu, J. Chen, Y.-S. Cheng, K. T. Hsu, K. H. Hu, and C. Y. Liao, “Reliability Improvement for the Insertion Device Control in the TPS”, in Proc. PCaPAC'18, Hsinchu City, Taiwan, Oct. 2018, pp. 173-175. doi:10.18429/JACoW-PCaPAC2018-THP06

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Paper Title: Reliability Improvement for the Insertion Device Control in the TPS
Paper URL: https://accelconf.web.cern.ch/pcapac2018/papers/THP06.pdf
Conference: 12th International Workshop on Personal Computers and Particle Accelerator Controls (PCaPAC'18)
Paper ID: THP06
Location in proceedings: 173-175
Original Author String: C. Y. Wu,J. Chen,Y.-S. Cheng,K. T. Hsu,K. H. Hu,C. Y. Liao

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