|
C. Xu, I. Ben-Zvi, M. Blaskiewicz, Y. Hao, and V. Ptitsyn, “Multiple Bunch HOM Evaluation for eRHIC Main Linac Cavities”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2525-2528. |
|
C. Xu, I. Ben-Zvi, Q. Wu, and T. Xin, “RF Energy Harvesting of HOM Power”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 180-182. |
|
C. Xu, I. Ben-Zvi, Y. Hao, V. Ptitsyn, W. Xu, and I. Petrushina, “Trapped Modes Study and BBU Analysis in the 5-Cell 650 MHz Cavity”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2529-2531. |
|
C. Xu, L. Shang, and W. Song, “A nanosecond power supply for grid-controlled electron gun used in HALF”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper WEPM092, pp. 3788-3790. |
|
C. Xu, M. J. Kelley, and C. E. Reece, “Analysis of High Field Non-Linear Losses on SRF Surfaces Due to Specific Topographic Roughness”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEEPPB011, pp. 2188-2190. |
|
C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper MOPB018, pp. 210-212. |
|
C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper SUPB001, pp. XX-XX. |
|
C. Xu, M. J. Kelley, and C. E. Reece, “Simulation of Non-linear RF Losses Derived from Characteristic Nb Topography”, in Proc. 16th Int. Conf. RF Superconductivity (SRF'13), Paris, France, Sep. 2013, paper TUP010, pp. 441-443. |
|
C. Xu, M. J. Kelley, and C. E. Reece, “SRF Cavity Surface Topography Characterization Using Replica Techniques”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper THPPC093, pp. 3497-3499. |
|
C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834. |
