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Author: J. Tuggle


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Reference
J. Tuggle, M. J. Kelley, U. Pudasaini, A. D. Palczewski, C. E. Reece, and F. A. Stevie, “Fundamental SIMS Analyses for Nitrogen-enriched Niobium”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 821-824.
U. Pudasaini, M. J. Kelley, G. V. Eremeev, C. E. Reece, and J. Tuggle, “Surface Studies of Nb3Sn Coated Samples Prepared under Different Coating Conditions”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 894-899.
U. Pudasaini, M. J. Kelley, G. V. Eremeev, C. E. Reece, and J. Tuggle, “Insights into Formation of Nb3Sn Film During the Vapor Diffusion Process”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 539-542.
J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, “Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 871-875.
U. Pudasaini, J. W. Angle, G. V. Eremeev, M. J. Kelley, C. E. Reece, and J. Tuggle, “Nb?Sn Films for SRF Cavities: Genesis and RF Properties”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 810-817.
J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, “Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 871-875.


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