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H. Tian, M. J. Kelley, and C. E. Reece, “Basic Electropolishing Process Research and Development in Support of Improved Reliable Performance SRF Cavities for the Future Accelerators”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper WE5PFP058, pp. 2135-2137. |
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H. Tian, C. E. Reece, W. Sommer, O. Trofimova, and L. Zhao, “Analysis of the Topographic Transformation of Niobium Surfaces Under Controlled EP Conditions”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUPPO081, pp. 422-425. |
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H. Tian, C. E. Reece, S. R. Brankovic, and N. Dole, “Detailed Nb Surface Morphology Evolution During Electropolishing for SRF Cavity Production”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO038, pp. 802-805. |
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H. Tian et al., “Recent XPS Studies of the Effect of Processing on NB SRF Surfaces”, in Proc. 13th Int. Conf. RF Superconductivity (SRF'07), Beijing, China, Oct. 2007, paper TUP18, pp. XX-XX. |
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H. Tian et al., “New Progress with HF-free Chemical Finishing for Nb SRF Cavities”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 431-434. |
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H. Tian et al., “Development of SIMS Standards for Measurement of H, C, O, N in Nb”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUPPO082, pp. 426-426. |
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H. Tian and C. E. Reece, “Quantitative EP Studies and Results for SRF Nb Cavity Production”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper WEIOA01, pp. 565-570. |
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H. Tian and C. E. Reece, “Evaluation of the Diffusion Coefficient of Fluorine during the Electropolishing of Niobium”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper THPPO060, pp. 738-741. |
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C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834. |
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C. E. Reece, A. D. Palczewski, and H. Tian, “A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces ÔÇô CYCLOPS”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper MOPB062, pp. 318-320. |
