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Author: P. Forck


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Reference
A. Lieberwirth et al., “Test of the Imaging Properties of Inorganic Scintillation Screens Using Fast and Slow Extracted Ion Beams”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 516-519.
M. Sapinski et al., “Ionization Profile Monitor Simulations - Status and Future Plans”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 520-523.
S. Udrea et al., “Preparatory Work for a Fluorescence Based Profile Monitor for an Electron Lens”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 528-531.
D. M. Vilsmeier, P. Forck, and M. Sapinski, “A Modular Application for IPM Simulations”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 355-358.
S. Udrea et al., “Development of a Fluorescence Based Gas Sheet Profile Monitor for Use With Electron Lenses: Optical System Design and Preparatory Experiments”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 359-363.
P. Forck, E. Guetlich, R. Haseitl, and P. Kowina, “Scintillation Screen Investigations for High Current Ion Beams at GSI Linac”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF008, pp. 100-104.
F. Becker, F. M. Bieniosek, P. Forck, D. H. H. Hoffmann, and P. N. Ni, “Beam Induced Fluorescence (BIF) Monitor for Intense Heavy Ion Beams”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF054, pp. 236-240.
B. Walasek-H?Âhne, W. Ensinger, P. Forck, E. Guetlich, and R. Haseitl, “Light Yield, Imaging Properties and Spectral Response of Inorganic Scintillators Under Intense Ion Irradiation”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM019, pp. 151-155.
F. Becker et al., “Beam Induced Fluorescence MonitorÔÇôSpectroscopy in Nitrogen, Helium, Argon, Krypton, and Xenon Gas”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM020, pp. 156-159.
U. Springer, P. Forck, P. H??lsmann, P. Kowina, and P. Moritz, “Digital Base-Band Tune Determination”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM071, pp. 341-344.


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