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Author: Y. B. Leng


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Reference
B. Gao, S. S. Cao, L. W. Lai, Y. B. Leng, and X. Q. Liu, “Bunch Purity Measurement for SSRF”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 99-102.
L. W. Lai, Y. B. Leng, and Y. B. Yan, “Development of Abnormal Beam State Monitoring Processor on SSRF Storage Ring”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 223-225.
J. Chen et al., “Precise Bunch Charge Measurement Using BPM Pickup”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 21-25.
S. S. Cao, R. Jiang, Y. B. Leng, and R. X. Yuan, “Design and Test of CBPM Prototypes for SHINE”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 124-127.
Y. M. Zhou, S. S. Cao, J. Chen, and Y. B. Leng, “Prototype Design of Bunch Arrival Time Measurement System Based on Cavity Monitor for SHINE”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 154-157.
R. Jiang, J. Chen, and Y. B. Leng, “High-Accuracy Diagnostic Tool for Beam Position Monitor Troubleshooting in SSRF Based on Clustering Analysis”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 166-169.
J. Wan et al., “Prototype Design of Wire Scanner for SHINE”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 285-287.
L. W. Lai et al., “Beam Instrumentation System for Shanghai Soft X-ray FEL Test Facility”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 17-20.
X. Y. Xu and Y. B. Leng, “Beam Coupling Impedance Analyze Using Bunch-by-Bunch Measurement”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 202-205.
B. Gao, F. Z. Chen, Y. B. Leng, and Y. M. Zhou, “Online Touschek Beam Lifetime Measurement Based on the Precise Bunch-By-Bunch Beam Charge Monitor”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 36-40.


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